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Img
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Pdf
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Part Number
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Manufacturers
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Desc
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In Stock
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Packing
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Rfq
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Element Bit per Element Output
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6408
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Linear Voltage Regulator IC Positive Fixed 1 Output 300mA 4-DSBGA (1x1)
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15
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4-WFBGA, DSBGA
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Buck Switching Regulator IC Positive Fixed 5V 1 Output 500mA 8-SOIC (0.154", 3.90mm Width)
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1537
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8-SOIC (0.154", 3.90mm Width)
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DRV1101 HIGH POWER DIFFERENTIAL
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41
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Buck Switching Regulator IC Positive Adjustable 1.2V 1 Output 5A TO-220-7 Formed Leads
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2980
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TO-220-7 Formed Leads
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Shunt Voltage Reference IC Fixed 1.225V V ±1% 12 mA SOT-23-3
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520
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TO-236-3, SC-59, SOT-23-3
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Linear Voltage Regulator IC Positive Fixed 1 Output 800mA SOT-223-5
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1
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TO-261-5, TO-261AB
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Comparator
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45
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Linear Voltage Regulator IC Positive Fixed 1 Output 100mA SOT-23-5
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1828
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SC-74A, SOT-753
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* Microcontroller IC
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2
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Buck Switching Regulator IC Positive Adjustable 0.8V 1 Output 1.5A 8-WFDFN Exposed Pad
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572
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8-WFDFN Exposed Pad
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Transceiver, Non-Inverting 1 Element 8 Bit per Element 3-State Output 24-SOP
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3
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24-SOIC (0.295", 7.50mm Width)
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Linear Voltage Regulator IC Positive Fixed 1 Output 150mA 5-DSBGA (1.41x1.08)
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3
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5-WFBGA, DSBGA
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LED Driver IC Output Dimming
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3
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Real Time Clock (RTC) IC Timer Clock Peripheral (TCP) 44B Parallel 28-LCC (J-Lead)
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239
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28-LCC (J-Lead)
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Shunt Voltage Reference IC Fixed 2.5V V ±3% 20 mA SOT-23-3
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2231
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TO-236-3, SC-59, SOT-23-3
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1/1 Transceiver Full RS422, RS485 8-SOIC
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2
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8-SOIC (0.154", 3.90mm Width)
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Comparator
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2
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Linear Voltage Regulator IC Positive Fixed 1 Output 1A SOT-223-4
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7893
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TO-261-4, TO-261AA
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Shunt Voltage Reference IC Fixed 1.225V V ±1% 12 mA SOT-23-3
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165
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TO-236-3, SC-59, SOT-23-3
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Flip Flop 2 Element JK Type 1 Bit Positive Edge 16-SOIC (0.154", 3.90mm Width)
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5
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16-SOIC (0.154", 3.90mm Width)
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Shunt Voltage Reference IC Fixed 5V V ±0.2% 15 mA SOT-23-3
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1
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TO-236-3, SC-59, SOT-23-3
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5.38Gbps Serializer 48 Input 8 Output 100-TQFP (14x14)
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157
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100-TQFP
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COP8 - Microcontroller IC 8-Bit 15MHz 8KB (8K x 8) OTP 28-DIP
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224
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28-DIP (0.600", 15.24mm)
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Buck Switching Regulator IC Positive Adjustable 0.8V 1 Output 500mA 10-WFBGA
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51
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10-WFBGA
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IC CPLD 8MC 25NS 24CDIP General Description The EECMOS GAL20V8QS devices are fabricated using National's CS80BEV 0.8μ Electrically Erasable CMOS pro-cess. This advanced process makes National's GAL20V8QS extremely fast, allowing controlled output edge rates which dramatically reduce noise. Low noise is actually specified and guaranteed with National's GAL20V8QS Quiet Series™ devices. National's fast programming algorithm allows the GAL20V8QS to be programmed significantly faster than similar devices using industry standard programmers. Fast programming reduces the cost of programming by greatly increasing programming throughput. National guarantees a minimum of 100 erase/write cycles. Unique test circuitry and reprogrammable cells allow com-plete AC, DC, cell, and functionality testing during manufac-ture. Therefore, National guarantees 100% field programm-ability and functionality of GAL® devices. In addition, a se-curity circuit is built-in,providing proprietary designs with copy protection. Features
-10 ns maximum propagation delay - 5 ns setup time delay - 7.5 ns clock to registered output delay - fMAx =80 MHz - Reduced ground bounce -2000V ESD protection
- lcc max = 90 mA @ 25 MHz
-100% tested at manufacture
-Reduces programming cost, increases throughput
How to choose FPGA for your project?
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6614
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24-CDIP (0.300
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4 FUNC, 4 DRIVER, BIPOLAR, PDSO
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5
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IC CPLD 8MC 15NS 20PLCC General Description The EECMOS GAL16V8QS devices are fabricated using National's CS80BEV 0.8μ Electrically Erasable CMOS pro-cess. This advanced process makes National's GAL16V8QS extremely fast, allowing controlled output edge rates which dramatically reduce noise. Low noise is actually specified and guaranteed with National's GAL16V8QS Quiet Series™ devices. National's fast programming algorithm allows the GAL16V8QS to be programmed significantly faster than similar devices using industry standard programmers. Fast programming reduces the cost of programming by greatly increasing programming throughput. National guarantees a minimum of 100 erase/write cycles. Unique test circuitry and reprogrammable cells allow com-plete AC, DC, cell, and functionality testing during manufac-ture. Therefore, National guarantees 100% field programm-ability and functionality of GAL® devices. In addition, a se-curity circuit is built-in,providing proprietary designs with copy protection. Features
-10 ns maximum propagation delay - 5 ns setup time delay - 7.5 ns clock to registered output delay - fMAx =80 MHz - Reduced ground bounce -2000V ESD protection
- lcc max = 90 mA @ 25 MHz
-100% tested at manufacture
-Reduces programming cost, increases throughput
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5
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20-LCC (J-Lead)
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Element Bit per Element Output
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1
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EE PLD, 15NS, PAL-TYPE General Description The EECMOS GAL20V8QS devices are fabricated using National's CS80BEV 0.8μ Electrically Erasable CMOS pro-cess. This advanced process makes National's GAL20V8QS extremely fast, allowing controlled output edge rates which dramatically reduce noise. Low noise is actually specified and guaranteed with National's GAL20V8QS Quiet Series™ devices. National's fast programming algorithm allows the GAL20V8QS to be programmed significantly faster than similar devices using industry standard programmers. Fast programming reduces the cost of programming by greatly increasing programming throughput. National guarantees a minimum of 100 erase/write cycles. Unique test circuitry and reprogrammable cells allow com-plete AC, DC, cell, and functionality testing during manufac-ture. Therefore, National guarantees 100% field programm-ability and functionality of GAL® devices. In addition, a se-curity circuit is built-in,providing proprietary designs with copy protection. Features
-10 ns maximum propagation delay - 5 ns setup time delay - 7.5 ns clock to registered output delay - fMAx =80 MHz - Reduced ground bounce -2000V ESD protection
- lcc max = 90 mA @ 25 MHz
-100% tested at manufacture
-Reduces programming cost, increases throughput
How to choose FPGA for your project?
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1
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DIP24
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