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Pdf
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Part Number
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Manufacturers
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Desc
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In Stock
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Packing
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Channel IC
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8963
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Amplifier IC
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3
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Buck Switching Regulator IC Positive Fixed 3.3V 1 Output 500mA 8-DIP (0.300", 7.62mm)
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227
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8-DIP (0.300", 7.62mm)
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PMIC
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6
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Memory IC
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210
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Interface
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572
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Element Bit per Element Output
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799
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* Microcontroller IC
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1
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Linear Voltage Regulator IC Positive Fixed 1 Output 150mA SOT-23-5
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7123
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SC-74A, SOT-753
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Switching Regulator IC Output
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574
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1/1 Transceiver Half RS422, RS485 8-SOIC
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5064
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8-SOIC (0.154", 3.90mm Width)
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Shunt Voltage Reference IC Adjustable 2.5V 36 VV ±2% 100 mA TO-92-3
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24
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TO-226-3, TO-92-3 (TO-226AA)
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Buck Switching Regulator IC Positive Adjustable 0.6V 1 Output 1A SC-74A, SOT-753
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555
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SC-74A, SOT-753
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Element Bit per Element Output
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1
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Shunt Voltage Reference IC Fixed 1.235V V ±1% 20 mA TO-46-2, Metal Can
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3
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TO-46-2 Metal Can
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Switching Regulator IC Output
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2
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Supervisor Push-Pull, Totem Pole 1 Channel SOT-23-3
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2
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TO-236-3, SC-59, SOT-23-3
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* Voltage Regulator IC Output
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750
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Buck Switching Regulator IC Positive Fixed 5V 1 Output 3A TO-263-6, D²Pak (5 Leads + Tab), TO-263BA
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1236
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TO-263-6, D²Pak (5 Leads + Tab), TO-263BA
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J-FET Amplifier 1 Circuit TO-99-8
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2
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TO-99-8 Metal Can
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Amplifier IC 1-Channel (Mono) Class AB 4-DSBGA
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958
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4-UFBGA, DSBGA
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Linear Voltage Regulator IC Positive Fixed 1 Output 800mA TO-263-5 Thin
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976
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TO-263-5 Thin
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Comparator General Purpose CMOS, Open-Collector, TTL 8-VSSOP
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3
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8-TSSOP, 8-MSOP (0.118", 3.00mm Width)
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IC CPLD 8MC 20NS 20PLCC General Description The EECMOS GAL16V8QS devices are fabricated using National's CS80BEV 0.8μ Electrically Erasable CMOS pro-cess. This advanced process makes National's GAL16V8QS extremely fast, allowing controlled output edge rates which dramatically reduce noise. Low noise is actually specified and guaranteed with National's GAL16V8QS Quiet Series™ devices. National's fast programming algorithm allows the GAL16V8QS to be programmed significantly faster than similar devices using industry standard programmers. Fast programming reduces the cost of programming by greatly increasing programming throughput. National guarantees a minimum of 100 erase/write cycles. Unique test circuitry and reprogrammable cells allow com-plete AC, DC, cell, and functionality testing during manufac-ture. Therefore, National guarantees 100% field programm-ability and functionality of GAL® devices. In addition, a se-curity circuit is built-in,providing proprietary designs with copy protection. Features
-10 ns maximum propagation delay - 5 ns setup time delay - 7.5 ns clock to registered output delay - fMAx =80 MHz - Reduced ground bounce -2000V ESD protection
- lcc max = 90 mA @ 25 MHz
-100% tested at manufacture
-Reduces programming cost, increases throughput
Commercial and industrial grades How to choose FPGA for your project?
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560
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20-LCC (J-Lead)
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Clock Generator IC 67.5MHz, 148.5MHz 1 32-WFQFN Exposed Pad
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85
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32-WFQFN Exposed Pad
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IC CPLD 8MC 20NS 20DIP General Description The EECMOS GAL16V8QS devices are fabricated using National's CS80BEV 0.8μ Electrically Erasable CMOS pro-cess. This advanced process makes National's GAL16V8QS extremely fast, allowing controlled output edge rates which dramatically reduce noise. Low noise is actually specified and guaranteed with National's GAL16V8QS Quiet Series™ devices. National's fast programming algorithm allows the GAL16V8QS to be programmed significantly faster than similar devices using industry standard programmers. Fast programming reduces the cost of programming by greatly increasing programming throughput. National guarantees a minimum of 100 erase/write cycles. Unique test circuitry and reprogrammable cells allow com-plete AC, DC, cell, and functionality testing during manufac-ture. Therefore, National guarantees 100% field programm-ability and functionality of GAL® devices. In addition, a se-curity circuit is built-in,providing proprietary designs with copy protection. Features
-10 ns maximum propagation delay - 5 ns setup time delay - 7.5 ns clock to registered output delay - fMAx =80 MHz - Reduced ground bounce -2000V ESD protection
- lcc max = 90 mA @ 25 MHz
-100% tested at manufacture
-Reduces programming cost, increases throughput
How to choose FPGA for your project?
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7318
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20-DIP (0.300
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Linear Voltage Regulator IC Positive Fixed 1 Output 150mA 5-DSBGA (1.41x1.08)
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129
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5-WFBGA, DSBGA
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LOW VOLTAGE E2CMOS PLD GENERIC A General Description The EECMOS GAL22CV10 devices are fabricated using electricaly erasable floating gate technology. This program-mable memory technology applied to array logic provides designers with reconfigurable logic and bipolar performance at significantly reduced power levels. The 24-pn GAL22CV10 features 10 programmable Output Logic Macrocells (OLMCs) allowing each TRI-STATE® out- put to be configured by the user. The GAL22CV10 is also cabable of emulating most popular 24-pin PAL®devices. Programming is accomplished using popular hardware and software tools. NSC guarantees a minimum of 100 erase/ write cycles. Unique test circultry and reprogrammable cells allow complete AC, DC, cell, and functionality testing during manufac- ture. Therefore, NSC guarantees 100% field programmability and functionality of NSC GAL®devices. In addition, a security circult is built-in, providing proprietary designs withcopy protection. Features
-10 ns maximum propagation delay -6 ns setup time delay -TTL compatible 16 mA outputs -2000V ESD protection
-lcc max =130 mA @ 25 MHz
-Reconfigurable logic -100% tested at manufacture
-Maximum flexibility for complex logic design -Programmable output polarity -Emulates popular PAL devices
development tools
How to choose FPGA for your project? |
4
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DIP24
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Counter IC Element Bit
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1620
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LOW VOLTAGE E2CMOS PLD GENERIC A General Description The NSC E²CMOS™ GAL人® devices combine a high per-formance CMOS process with electrically erasable floating gate technology. This programmable memory technology applied to array logic provides designers with reconfigurable logic and bipolar performance at significantly reduced pow-er levels. The 24-pin GAL22V10 features 22 inputs, and 10 program-mable Output Logic Macro Cells (OLMCs) allowing each TRI-STATE® output to be configured by the user. The archi-tecture of each output is user-programmable for registered or combinatorial operation, active high or low polarity, and as an input, output or bidirectional I/O. This architecture features variable product term distribution, from 8 to 16 logi-cal product terms to each output, as shown in the logic dia- gram. CMOS circuitry allows the GAL22V10 to consume just 90 mA typical lcc which represents a 50% saving in power when compared to its bipolar counterparts. Synchronous preset and asynchronous reset product terms have been added which are common to all output registers to enhance system operation. The GAL22V10 is directly compatible with the bipolar PAL22V10 in terms of functionality, fuse map, pinout, and electrical characteristics. Programming is accomplished using industry standard avail-able hardware and software tools. NSC guarantees a mini- mum 100 erase/write cycles. Unique test circuitry and reprogrammable cells allow com-plete AC, DC, cell and functionality testing during manufac- ture. Therefore, NSC guarantees 100% field programmabili-ty of all GAL devices. In addition, electronic signature is available to provide positive device ID. A security circuit isbuilt-in, providing proprietary designs with copy protection. Features
-15 ns maximum propagation delay -fmax = 45 MHz with feedback -TTL compatible 16 mA outputs -UltraMOS® Ill advanced CMOS technology -Internal pull-up resistor on all pins
-Reconfigurable logic -Reprogrammable cells -100% tested/guaranteed 100% yields -High speed electrical erasure(<50 ms) -20 year data retention
-Maximum Flexibility -Programmable output polarity -Maximum flexibility for complex logic designs -Full function/fuse map/parametric compatibility with PAL22V10 devices
-From 8 to 16 product terms per output data function
-100% functional testability
How to choose FPGA for your project? |
310
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DIP24
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